红外光谱仪尺寸图标

AFM 工业的 用于研发

Highest performance, large-sample nanoIR with PeakForce property mapping Bruker’s large-sample Dimension IconIR system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications. Large-Sample highest performance nanoIR spectroscopy Provides increased flexibility and performance across sample types and applications. Correlative chemical and nanoscale property mapping Delivers quantitative nanochemical, nanomechanical, and nanoelectrical data. Sub-10nm photothermal AFM-IR imaging Enables highest resolution characterization with monolayer sensitivity. First-and-Only nanoIR Capabilities and Performance In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity.